Our technology will improve chip manufacturing yield significantly and prevent critical yield excursions. Our customers will be able to increase their profit due to a much more efficient and hence also more environmentally friendly and sustainable production.
UNISERS’ technology serves the entire semiconductor ecosystem. The areas of applications can be divided into two main categories: Defect Review and Liquid Defectivity.
Current technologies only monitor total particle count on unpatterned wafers, missing some of the killer excursions causing significant losses due to late detection.
We add particle classification on unpatterned wafers, enabling monitoring of specific defect types and identifying these excursions much earlier.
